"A Well-Defined Estelle Specification for the Automatic Test Generation."

Do Y. Lee, Jai-Yong Lee (1991)

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DOI: 10.1109/12.88471

access: closed

type: Journal Article

metadata version: 2017-05-20

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Do Y. Lee, Jai-Yong Lee:
A Well-Defined Estelle Specification for the Automatic Test Generation. IEEE Trans. Computers 40(4): 526-542 (1991)

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