"Aliasing Error for a Mask ROM Built-In Self-Test."

Kazuhiko Iwasaki, Shigeo Nakamura (1996)

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DOI: 10.1109/12.485566

access: closed

type: Journal Article

metadata version: 2017-05-20

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  - https://dblp.org/rec/journals/tc/IwasakiN96
Kazuhiko Iwasaki, Shigeo Nakamura:
Aliasing Error for a Mask ROM Built-In Self-Test. IEEE Trans. Computers 45(3): 270-277 (1996)

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