"Test Point Placement to Simplify Fault Detection."

John P. Hayes, Arthur D. Friedman (1974)

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DOI: 10.1109/T-C.1974.224021

access: closed

type: Journal Article

metadata version: 2017-05-20

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John P. Hayes, Arthur D. Friedman:
Test Point Placement to Simplify Fault Detection. IEEE Trans. Computers 23(7): 727-735 (1974)

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