"MOS Test Pattern Generation Using Path Algebras."

Robert I. Damper, N. Burgess (1987)

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DOI: 10.1109/TC.1987.5009546

access: closed

type: Journal Article

metadata version: 2017-05-20

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Robert I. Damper, N. Burgess:
MOS Test Pattern Generation Using Path Algebras. IEEE Trans. Computers 36(9): 1123-1128 (1987)

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