"Test Resource Reused Debug Scheme to Reduce the Post-Silicon Debug Cost."

Inhyuk Choi et al. (2018)

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DOI: 10.1109/TC.2018.2835462

access: closed

type: Journal Article

metadata version: 2024-02-27

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Inhyuk Choi, Hyunggoy Oh, Young-Woo Lee, Sungho Kang:
Test Resource Reused Debug Scheme to Reduce the Post-Silicon Debug Cost. IEEE Trans. Computers 67(12): 1835-1839 (2018)

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