"Reliability Enhancement of Flash-Memory Storage Systems: An Efficient ..."

Yuan-Hao Chang et al. (2013)

> Home

Details and statistics

DOI: 10.1109/TC.2012.131

access: closed

type: Journal Article

metadata version: 2021-01-05

- view
  authority control:
- export record
  dblp key:
  - journals/tc/ChangHHLKD13
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tc/ChangHHLKD13
Yuan-Hao Chang, Po-Chun Huang, Pei-Han Hsu, Lue-Jane Lee, Tei-Wei Kuo, David Hung-Chang Du:
Reliability Enhancement of Flash-Memory Storage Systems: An Efficient Version-Based Design. IEEE Trans. Computers 62(12): 2503-2515 (2013)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.