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"A Semi-Automated Positioning System for Contact-Mode Atomic Force ..."

Rajarshi Roy et al. (2013)

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DOI: 10.1109/TASE.2012.2226154

access: closed

type: Journal Article

metadata version: 2020-10-30

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Rajarshi Roy, Wenjin Chen, Lei Cong, Lauri A. Goodell, David J. Foran, Jaydev P. Desai:
A Semi-Automated Positioning System for Contact-Mode Atomic Force Microscopy (AFM). IEEE Trans Autom. Sci. Eng. 10(2): 462-465 (2013)

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