"Effect of Voids behind Lining on the Failure Behavior of Symmetrical ..."

Xu Zhang et al. (2019)

> Home

Details and statistics

DOI: 10.3390/SYM11101321

access: open

type: Journal Article

metadata version: 2019-11-26

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/symmetry/ZhangYMX19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/symmetry/ZhangYMX19
Xu Zhang, Zijian Ye, Bo Min, Youjun Xu:
Effect of Voids behind Lining on the Failure Behavior of Symmetrical Double-Arch Tunnels. Symmetry 11(10): 1321 (2019)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.