"A New Experimental Method for Determining the Thickness of Thin Surface ..."

Alexander S. Smirnov, Evgeniya Smirnova, Sergey Alexandrov (2020)

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DOI: 10.3390/SYM12040677

access: open

type: Journal Article

metadata version: 2020-11-18

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  - https://dblp.org/rec/journals/symmetry/SmirnovSA20
Alexander S. Smirnov, Evgeniya Smirnova, Sergey Alexandrov:
A New Experimental Method for Determining the Thickness of Thin Surface Layers of Intensive Plastic Deformation Using Electron Backscatter Diffraction Data. Symmetry 12(4): 677 (2020)

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