"Pattern Recognition and Deep Learning Technologies, Enablers of Industry ..."

Joel Serey et al. (2023)

> Home

Details and statistics

DOI: 10.3390/SYM15020535

access: open

type: Journal Article

metadata version: 2023-03-21

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/symmetry/SereyAFVDTRS23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/symmetry/SereyAFVDTRS23
Joel Serey, Miguel D. Alfaro, Guillermo Fuertes, Manuel Vargas, Claudia A. Durán, Rodrigo Ternero, Ricardo Rivera, Jorge Sabattin:
Pattern Recognition and Deep Learning Technologies, Enablers of Industry 4.0, and Their Role in Engineering Research. Symmetry 15(2): 535 (2023)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.