"In Situ Transmission Electron Microscopy: Signal processing challenges and ..."

Josh Kacher et al. (2022)

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DOI: 10.1109/MSP.2021.3119284

access: closed

type: Journal Article

metadata version: 2022-10-02

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Josh Kacher, Yao Xie, Sven P. Voigt, Shixiang Zhu, Henry Shaowu Yuchi, Jordan Key, Surya R. Kalidindi:
In Situ Transmission Electron Microscopy: Signal processing challenges and examples. IEEE Signal Process. Mag. 39(1): 89-103 (2022)

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