"Automatic Defect Classification Using Frequency and Spatial Features in a ..."

Hong Il Kim, Sang Hwa Lee, Nam Ik Cho (2009)

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DOI: 10.1109/LSP.2009.2016467

access: closed

type: Journal Article

metadata version: 2018-11-02

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Hong Il Kim, Sang Hwa Lee, Nam Ik Cho:
Automatic Defect Classification Using Frequency and Spatial Features in a Boosting Scheme. IEEE Signal Process. Lett. 16(5): 374-377 (2009)

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