"Learning Traces by Yourself: Blind Image Forgery Localization via Anomaly ..."

Tong Chen, Bin Li, Jinhua Zeng (2023)

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DOI: 10.1109/LSP.2023.3245947

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type: Journal Article

metadata version: 2023-03-11

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Tong Chen, Bin Li, Jinhua Zeng:
Learning Traces by Yourself: Blind Image Forgery Localization via Anomaly Detection With ViT-VAE. IEEE Signal Process. Lett. 30: 150-154 (2023)

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