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"MeaSSUre:I-V: Open software for transistor characterization using ..."
Hongseok Oh, Hyunsoo Kim, Hyerin Jo (2023)
- Hongseok Oh, Hyunsoo Kim, Hyerin Jo:
MeaSSUre:I-V: Open software for transistor characterization using source-meter units. SoftwareX 21: 101318 (2023)
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