"Rapid Embedded System Testing Using Verification Patterns."

Wei-Tek Tsai et al. (2005)

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DOI: 10.1109/MS.2005.103

access: closed

type: Journal Article

metadata version: 2020-06-08

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Wei-Tek Tsai, Lian Yu, Feng Zhu, Raymond A. Paul:
Rapid Embedded System Testing Using Verification Patterns. IEEE Softw. 22(4): 68-75 (2005)

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