"A variable-level automated defect identification model based on machine ..."

Yuwei Zhang et al. (2020)

> Home

Details and statistics

DOI: 10.1007/S00500-019-03942-3

access: open

type: Journal Article

metadata version: 2023-03-01

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/soco/ZhangXGJLL20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/soco/ZhangXGJLL20
Yuwei Zhang, Ying Xing, Yunzhan Gong, Dahai Jin, Honghui Li, Feng Liu:
A variable-level automated defect identification model based on machine learning. Soft Comput. 24(2): 1045-1061 (2020)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.