"Patent data analysis using functional count data model."

Jong-Min Kim et al. (2019)

> Home

Details and statistics

DOI: 10.1007/S00500-018-3481-6

access: closed

type: Journal Article

metadata version: 2024-04-05

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/soco/KimKJJ19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/soco/KimKJJ19
Jong-Min Kim, Nak-Kyeong Kim, Yoon-Sung Jung, Sunghae Jun:
Patent data analysis using functional count data model. Soft Comput. 23(18): 8815-8826 (2019)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.