"A Deep Learning framework for simulation and defect prediction applied in ..."

Nikolaos Dimitriou et al. (2020)

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DOI: 10.1016/J.SIMPAT.2019.102063

access: closed

type: Journal Article

metadata version: 2023-03-21

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Nikolaos Dimitriou, Lampros Leontaris, Thanasis Vafeiadis, Dimosthenis Ioannidis, Tracy Wotherspoon, Gregory Tinker, Dimitrios Tzovaras:
A Deep Learning framework for simulation and defect prediction applied in microelectronics. Simul. Model. Pract. Theory 100: 102063 (2020)

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