"A paradigm for metric based inspection process for enhancing defect ..."

T. R. Gopalakrishnan Nair, V. Suma (2010)

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DOI: 10.1145/1764810.1764827

access: closed

type: Journal Article

metadata version: 2020-09-17

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T. R. Gopalakrishnan Nair, V. Suma:
A paradigm for metric based inspection process for enhancing defect management. ACM SIGSOFT Softw. Eng. Notes 35(3): 1 (2010)

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