"Estimating second-order Volterra system parameters from noisy measurements ..."

Zoé Sigrist, Éric Grivel, Benoît Alcoverro (2012)

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DOI: 10.1016/J.SIGPRO.2011.10.013

access: closed

type: Journal Article

metadata version: 2021-01-08

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Zoé Sigrist, Éric Grivel, Benoît Alcoverro:
Estimating second-order Volterra system parameters from noisy measurements based on an LMS variant or an errors-in-variables method. Signal Process. 92(4): 1010-1020 (2012)

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