"Perfectly-Matched-Layer Truncation is Exponentially Accurate at High ..."

Jeffrey Galkowski, David Lafontaine, Euan A. Spence (2023)

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DOI: 10.1137/21M1443716

access: closed

type: Journal Article

metadata version: 2023-08-31

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Jeffrey Galkowski, David Lafontaine, Euan A. Spence:
Perfectly-Matched-Layer Truncation is Exponentially Accurate at High Frequency. SIAM J. Math. Anal. 55(4): 3344-3394 (2023)

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