"Blackbox Identity Testing for Bounded Top-Fanin Depth-3 Circuits: The ..."

Nitin Saxena, C. Seshadhri (2012)

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DOI: 10.1137/10848232

access: closed

type: Journal Article

metadata version: 2022-07-07

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Nitin Saxena, C. Seshadhri:
Blackbox Identity Testing for Bounded Top-Fanin Depth-3 Circuits: The Field Doesn't Matter. SIAM J. Comput. 41(5): 1285-1298 (2012)

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