"Detecting Inclusions in Electrical Impedance Tomography Without Reference ..."

Bastian von Harrach, Jin Keun Seo (2009)

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DOI: 10.1137/08072142X

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type: Journal Article

metadata version: 2020-05-20

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Bastian von Harrach, Jin Keun Seo:
Detecting Inclusions in Electrical Impedance Tomography Without Reference Measurements. SIAM J. Appl. Math. 69(6): 1662-1681 (2009)

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