default search action
"An Optical Diffuse Reflectance Model for the Characterization of a Si ..."
Artur Zarzycki et al. (2019)
- Artur Zarzycki, July Galeano, Sylwester Bargiel, Aurore Andrieux, Christophe Gorecki:
An Optical Diffuse Reflectance Model for the Characterization of a Si Wafer with an Evaporated SiO2 Layer. Sensors 19(4): 892 (2019)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.