"Hybrid Bright-Dark-Field Microscopic Fringe Projection System for Cu ..."

Dezhao Wang et al. (2024)

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DOI: 10.3390/S24165157

access: open

type: Journal Article

metadata version: 2024-10-06

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Dezhao Wang, Weihu Zhou, Zili Zhang, Fanchang Meng:
Hybrid Bright-Dark-Field Microscopic Fringe Projection System for Cu Pillar Height Measurement in Wafer-Level Package. Sensors 24(16): 5157 (2024)

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