"Chip Appearance Defect Recognition Based on Convolutional Neural Network."

Jun Wang, Xiaomeng Zhou, Jingjing Wu (2021)

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DOI: 10.3390/S21217076

access: open

type: Journal Article

metadata version: 2021-11-18

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Jun Wang, Xiaomeng Zhou, Jingjing Wu:
Chip Appearance Defect Recognition Based on Convolutional Neural Network. Sensors 21(21): 7076 (2021)

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