"Fast Industrial Inspection of Optical Thin Film Using Optical Coherence ..."

Muhammad Faizan Shirazi et al. (2016)

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DOI: 10.3390/S16101598

access: open

type: Journal Article

metadata version: 2020-11-05

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Muhammad Faizan Shirazi, Kibeom Park, Ruchire Eranga Wijesinghe, Hyosang Jeong, Sangyeob Han, Pilun Kim, Mansik Jeon, Jeehyun Kim:
Fast Industrial Inspection of Optical Thin Film Using Optical Coherence Tomography. Sensors 16(10): 1598 (2016)

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