"Fully Depleted, Trench-Pinned Photo Gate for CMOS Image Sensor Applications."

François Roy et al. (2020)

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DOI: 10.3390/S20030727

access: open

type: Journal Article

metadata version: 2020-05-30

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François Roy, Andrej Suler, Thomas Dalleau, Romain Duru, Daniel Benoit, Jihane Arnaud, Yvon Cazaux, Catherine Chaton, Laurent Montès, Panagiota Morfouli, Guo-Neng Lu:
Fully Depleted, Trench-Pinned Photo Gate for CMOS Image Sensor Applications. Sensors 20(3): 727 (2020)

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