"Two-Scale Simulation of Drop-Induced Failure of Polysilicon MEMS Sensors."

Stefano Mariani et al. (2011)

> Home

Details and statistics

DOI: 10.3390/S110504972

access: open

type: Journal Article

metadata version: 2019-10-19

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/sensors/MarianiGCMS11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/sensors/MarianiGCMS11
Stefano Mariani, Aldo Ghisi, Alberto Corigliano, Roberto Martini, Barbara Simoni:
Two-Scale Simulation of Drop-Induced Failure of Polysilicon MEMS Sensors. Sensors 11(5): 4972-4989 (2011)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.