"Raman Spectroscopy-Based Quality Control of "Silicon-On-Insulator" ..."

Kristina A. Malsagova et al. (2021)

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DOI: 10.3390/S21041333

access: open

type: Journal Article

metadata version: 2024-01-26

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Kristina A. Malsagova, Vladimir P. Popov, Igor N. Kupriyanov, Tatyana O. Pleshakova, Rafael A. Galiullin, Andrey F. Kozlov, Ivan D. Shumov, Dmitry I. Larionov, Fedor V. Tikhonenko, Svetlana I. Kapustina, Vadim S. Ziborov, Oleg F. Petrov, Olga A. Gadzhieva, Boris A. Bashiryan, Vadim N. Shimansky, Alexander I. Archakov, Yuri D. Ivanov:
Raman Spectroscopy-Based Quality Control of "Silicon-On-Insulator" Nanowire Chips for the Detection of Brain Cancer-Associated MicroRNA in Plasma. Sensors 21(4): 1333 (2021)

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