"Experimental Study on Damage Effect of Mid-Infrared Pulsed Laser on Charge ..."

Yang Liu et al. (2024)

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DOI: 10.3390/S24134380

access: open

type: Journal Article

metadata version: 2024-08-22

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Yang Liu, Feng Zhou, Yunzhe Wang, Yin Zhang, Yunfeng Zhang, Hanyu Zheng, Junfeng Shao:
Experimental Study on Damage Effect of Mid-Infrared Pulsed Laser on Charge Coupled Device (CCD) and HgCgTe Detectors. Sensors 24(13): 4380 (2024)

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