"Classifying Image Stacks of Specular Silicon Wafer Back Surface Regions: ..."

Corinna Kofler, Robert Muhr, Gunter Spöck (2019)

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DOI: 10.3390/S19092056

access: open

type: Journal Article

metadata version: 2019-07-29

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Corinna Kofler, Robert Muhr, Gunter Spöck:
Classifying Image Stacks of Specular Silicon Wafer Back Surface Regions: Performance Comparison of CNNs and SVMs. Sensors 19(9): 2056 (2019)

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