"Success Probability Characterization of Long-Range in Low-Power Wide Area ..."

Yi-Kang Kim, Seung-Yeon Kim (2020)

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DOI: 10.3390/S20236861

access: open

type: Journal Article

metadata version: 2021-06-01

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Yi-Kang Kim, Seung-Yeon Kim:
Success Probability Characterization of Long-Range in Low-Power Wide Area Networks. Sensors 20(23): 6861 (2020)

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