default search action
"Test Structure Design for Defect Detection during Active Thermal Cycling."
Ciprian Florea et al. (2022)
- Ciprian Florea, Dan Simon, Adrian Bojita, Marius Purcar, Cristian Boianceanu, Vasile Topa:
Test Structure Design for Defect Detection during Active Thermal Cycling. Sensors 22(19): 7223 (2022)
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.