"Layer Contour Verification in Additive Manufacturing by Means of ..."

David Blanco Fernandez et al. (2020)

> Home

Details and statistics

DOI: 10.3390/S20010001

access: open

type: Journal Article

metadata version: 2024-07-04

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/sensors/FernandezFNAV20
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/sensors/FernandezFNAV20
David Blanco Fernandez, Pedro Fernández, A. Noriega, Braulio Jose Alvarez, Gonzalo Valiño:
Layer Contour Verification in Additive Manufacturing by Means of Commercial Flatbed Scanners. Sensors 20(1): 1 (2020)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.