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"Random Telegraph Noises from the Source Follower, the Photodiode Dark ..."

Calvin Yi-Ping Chao et al. (2019)

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DOI: 10.3390/S19245447

access: open

type: Journal Article

metadata version: 2020-05-30

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  - journals/sensors/ChaoYWCTLYPG19
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  - https://dblp.org/rec/journals/sensors/ChaoYWCTLYPG19
Calvin Yi-Ping Chao, Shang-Fu Yeh, Meng-Hsu Wu, Kuo-Yu Chou, Honyih Tu, Chih-Lin Lee, Chin Yin, Philippe Paillet, Vincent Goiffon:
Random Telegraph Noises from the Source Follower, the Photodiode Dark Current, and the Gate-Induced Sense Node Leakage in CMOS Image Sensors. Sensors 19(24): 5447 (2019)

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