"Traceable Reference Full Metrology Chain for Innovative Aspheric and ..."

Yassir Arezki et al. (2021)

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DOI: 10.3390/S21041103

access: open

type: Journal Article

metadata version: 2025-03-03

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Yassir Arezki, Rong Su, Ville Heikkinen, François Leprete, Pavel Psota, Youichi Bitou, Christian Schober, Charyar-Mehdi Souzani, Bandar Abdulrahman Mohammed Alzahrani, Xiangchao Zhang, Yohan Kondo, Christof Pruss, Vit Ledl, Nabil Anwer, Mohamed Lamjed Bouazizi, Richard K. Leach, Hichem Nouira:
Traceable Reference Full Metrology Chain for Innovative Aspheric and Freeform Optical Surfaces Accurate at the Nanometer Level. Sensors 21(4): 1103 (2021)

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