"Non-scan design for testable data paths using thru operation."

Katsuyuki Takabatake et al. (1997)

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DOI: 10.1002/(SICI)1520-684X(199709)28:10<60::AID-SCJ7>3.0.CO;2-A

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type: Journal Article

metadata version: 2023-09-13

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Katsuyuki Takabatake, Michiko Inoue, Toshimitsu Masuzawa, Hideo Fujiwara:
Non-scan design for testable data paths using thru operation. Syst. Comput. Jpn. 28(10): 60-68 (1997)

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