"Built-in Self-Test for crosstalk faults in a digital VLSI."

Kazuya Shimizu, Noriyoshi Itazaki, Kozo Kinoshita (2002)

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DOI: 10.1002/SCJ.1171

access: closed

type: Journal Article

metadata version: 2023-09-13

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Kazuya Shimizu, Noriyoshi Itazaki, Kozo Kinoshita:
Built-in Self-Test for crosstalk faults in a digital VLSI. Syst. Comput. Jpn. 33(13): 35-47 (2002)

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