"Defect detection method for stamped patterns utilizing random access ..."

Yoshihiro Shima, Seiji Kashioka, Toshikazu Yasue (1987)

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DOI: 10.1002/SCJ.4690180108

access: closed

type: Journal Article

metadata version: 2023-09-13

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Yoshihiro Shima, Seiji Kashioka, Toshikazu Yasue:
Defect detection method for stamped patterns utilizing random access parallel matching technique. Syst. Comput. Jpn. 18(1): 79-90 (1987)

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