"Fault detection for IC board using histogram of thermography."

Satoshi Nishino, Kenji Ohshima (2001)

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DOI: 10.1002/SCJ.1068

access: closed

type: Journal Article

metadata version: 2023-09-13

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Satoshi Nishino, Kenji Ohshima:
Fault detection for IC board using histogram of thermography. Syst. Comput. Jpn. 32(11): 38-48 (2001)

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