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"EB tester fault localization algorithm for combinational circuits by ..."
Koji Nakamae, Takashi Ishimura, Hiromu Fujioka (2000)
- Koji Nakamae, Takashi Ishimura, Hiromu Fujioka:
EB tester fault localization algorithm for combinational circuits by utilizing fault simulation and test pattern sequence for EB tester. Syst. Comput. Jpn. 31(8): 41-48 (2000)
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