"BIST-oriented test pattern generator for detection of transition faults."

Takeshi Asakawa, Kazuhiko Iwasaki, Seiji Kajihara (2003)

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DOI: 10.1002/SCJ.1196

access: closed

type: Journal Article

metadata version: 2023-09-13

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Takeshi Asakawa, Kazuhiko Iwasaki, Seiji Kajihara:
BIST-oriented test pattern generator for detection of transition faults. Syst. Comput. Jpn. 34(3): 76-84 (2003)

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