"An in-depth empirical analysis of patent citation counts using ..."

Yong-Gil Lee et al. (2007)

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DOI: 10.1007/S11192-007-0102-Z

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type: Journal Article

metadata version: 2023-09-30

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Yong-Gil Lee, Jeong-Dong Lee, Yong-Il Song, Se-Jun Lee:
An in-depth empirical analysis of patent citation counts using zero-inflated count data model: The case of KIST. Scientometrics 70(1): 27-39 (2007)

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