"Two-phase edge outlier detection method for technology opportunity discovery."

Byunghoon Kim et al. (2017)

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DOI: 10.1007/S11192-017-2472-1

access: closed

type: Journal Article

metadata version: 2024-03-25

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Byunghoon Kim, Gianluca Gazzola, Jaekyung Yang, Jae-Min Lee, Byoung-Youl Coh, Myong K. Jeong, Young-Seon Jeong:
Two-phase edge outlier detection method for technology opportunity discovery. Scientometrics 113(1): 1-16 (2017)

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