"Using the entropy-based patent measure to explore the influences of ..."

Yu-Shan Chen, Ke-Chiun Chang (2012)

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DOI: 10.1007/S11192-011-0557-9

access: closed

type: Journal Article

metadata version: 2020-07-17

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  - https://dblp.org/rec/journals/scientometrics/ChenC12
Yu-Shan Chen, Ke-Chiun Chang:
Using the entropy-based patent measure to explore the influences of related and unrelated technological diversification upon technological competences and firm performance. Scientometrics 90(3): 825-841 (2012)

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