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"Flip-flop selection for partial enhance scan chain using DTESFF for high ..."

Ashok Kumar Suhag, Vivek Shrivastava, Nidhi Singh (2013)

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DOI: 10.1007/S13198-013-0170-9

access: closed

type: Journal Article

metadata version: 2023-09-30

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Ashok Kumar Suhag, Vivek Shrivastava, Nidhi Singh:
Flip-flop selection for partial enhance scan chain using DTESFF for high transition delay fault coverage. Int. J. Syst. Assur. Eng. Manag. 4(3): 303-311 (2013)

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