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"Early fault detection model using integrated and cost-effective test case ..."

Ajeet Kumar Pandey, Vivek Shrivastava (2011)

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DOI: 10.1007/S13198-011-0056-7

access: closed

type: Journal Article

metadata version: 2023-05-01

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Ajeet Kumar Pandey, Vivek Shrivastava:
Early fault detection model using integrated and cost-effective test case prioritization. Int. J. Syst. Assur. Eng. Manag. 2(1): 41-47 (2011)

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