"One-shot device test data analysis using non-parametric and ..."

Xiaojun Zhu, N. Balakrishnan (2022)

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DOI: 10.1016/J.RESS.2022.108319

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type: Journal Article

metadata version: 2023-07-04

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Xiaojun Zhu, N. Balakrishnan:
One-shot device test data analysis using non-parametric and semi-parametric inferential methods and applications. Reliab. Eng. Syst. Saf. 221: 108319 (2022)

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