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"Remaining useful life prediction for stochastic degrading devices ..."
Jian-Xun Zhang et al. (2024)
- Jian-Xun Zhang, Jia-Ling Zhang, Zheng-Xin Zhang, Tian-Mei Li, Xiao-Sheng Si:
Remaining useful life prediction for stochastic degrading devices incorporating quantization. Reliab. Eng. Syst. Saf. 250: 110223 (2024)
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